YEA Engineering

Cutting edge industrial applications like Autonomous Vehicles and 5G wireless communication require cutting edge integrated circuits (ICs) - from high power ICs to mmWave frequency ICs.

New test procedures, new testers and new test methodologies of these ICs need to be developed - both for characterization and production.

Portfolio

In our portfolio we have products and solutions for:

High-Power IC Test (up to 4000V and up to 400A)
RF IC and RF MCU Test
Digital IC Test (up to 200 MHz, up to 512 channels)
Mixed Signal IC Test (up to 24 bits and 5 GHz sampling capabilities, up to 12.5 Gbs serial link)

Services

Test Solutions development for Characterization and Production Test.
Test Methods, Measurements Libraries and Test Programs development.
5G IC Test including Over-the-Air Test.
Load Board design.
Semiconductor Test Systems (STS) bring-up.
Handler/Prober driver development.
SystemLink based Distributed Test Systems Management.
Cloud Based Instrumentation and Test Systems

Testers

TSMixed-Tester for incoming inspection of Analog, Digital and Mixed Signal Devices

TSMixed is a cost-effective software and hardware platform designed for functional control, testing, measuring static and dynamic parameters of various types of analog, digital and mixed signal devices.

TSSemi 1200A

Automated test and measurement system for high-power semiconductor devices (hereinafter referred to as tester) designed for automated measurement and control of static and dynamic parameters of high-power semiconductor devices at the various

TSAnalog-Tester for Incoming Inspection of Analog IC's

The TSAnalog tester is a cost-effective software and hardware system for performing functional control, measuring the static and dynamic parameters of analog integrated circuits and systems in a wide range of assemblies.

TSDigital-Tester for Incoming Inspection of Digital IC's

The TSDigital tester is a cost-effective software and hardware system for performing functional control, measuring the static and dynamic parameters of digital integrated circuits and systems in a wide range of assemblies.

Test Solutions

High-Power PMIC Automated Testing System

The system is designed for automated testing of linear and pulsing DC-to-DC voltage converters. It allows to perform high accuracy measurements of static and dynamic parameters of packaged and wafer level PMIC with up to 60V and up to 10A.

Operational Amplifiers Test System

The system is designed to measure DC parameters and detect failures of operational amplifiers, which enabled to monitor quality of the production.

Universal Test System for Electronic Components

The system is designed to test electronic components of different types and functionality. The system combines a wide range of measurement capabilities.

High-Speed ADCs Test System

The system is designed for functional and parametric control of dynamic and static parameters of high-speed ADCs (up to 1 GHz). The test system is based on the NI PXI platform and uses software developed in the NI LabVIEW graphical programming environment.

Software Products

OTA Power Measurement Toolkit for CATR Method

“OTA Power Measurement Toolkit for CATR Method” is a set of functions that allow to perform Effective Isotropic Radiated Power (EIRP), Total Radiated Power (TRP) and Sensitivity Measurements in Over-the-Air (OTA) Test Setup using Compact Antenna Test Range (CATR) Method according to 3GPP 38.810 Specification.

Wafer Level Reliability Test Toolkit

Wafer-Level Reliability Test (WLR Test) Toolkit along with National Instruments PXI SMU modules are used for semiconductor device reliability estimation at the extreme ends of the device specifications (voltage and temperature).

A/D Converters Test Data Analyzer Toolkit

The A/D Converter TDA is a toolkit for analyzing the analog-to-digital converter output test signals. It allows you to use NI LabVIEW for developing automated ADC testing and characterization systems software, both of which can be used in mass-production automated test systems and R&D to reduce development time and improve reliability by providing ready-to-use algorithms.

Hardware Products

High-power SMU Family VCS

VCS is a series of high-power SMUs designed for sourcing and measuring up to 400A and 2000V. The modular architecture allows connecting more than one SMU to a single control bus and extend the total channels capability.

High-Voltage Generator & Analyzer

High-voltage Generator & Analyzer is a device, intended for different materials characteristics investigation with piezo-mesh-modules. This device will be controlled from PC or laptop with easy to use graphical user interface (GUI).

Impedance Reader Front-End Module

The Impedance Reader Front-End Module (FEM) is designed to be used in ATE for on-wafer or packaged semiconductor IC and piezo structures impedance measurements.

Prototyping Platforms

Electronic Components Characterization Prototyping Platform

The Electronic Components Characterization Prototyping Platform is based on the NI VirtualBench platform. The software is developed in the NI LabVIEW graphical programming environment. The platform is used to perform laboratory works on «Electronics», «Measurement technology», «Automated testing systems» and «Information and measurements systems».

Semiconductor