Semiconductor > Operational Amplifiers Test System

OVERVIEW

 

The system is designed to measure DC parameters and detect failures of operational amplifiers, which enabled to monitor quality of the production.

The system is based on the NI PXI platform and uses software developed in the NI LabVIEW graphical programming environment. It allows electronic manufacturers to minimize and prevent making defective production.

Measurements

  • Voltage gain

  • Conversion ratio

  • Maximum output voltage

  • Maximum output current

  • Input current

  • Current consumption

  • Offset voltage


ADDRESS

Engineering City
Nor Nork, 0062
Yerevan

CONTACT US

info@yeae.am
+374 (55) 525 608