OVERVIEW
The system is designed for automated testing of linear and pulsing DC-to-DC voltage converters. It allows to perform high accuracy measurements of static and dynamic parameters of packaged and wafer level PMIC with up to 60V and up to 10A. The system is able to connect with various peripheral devices such as temperature chambers, handlers, probers etc.
Features
- Testing of PMIC parameters up to 60V and 10A
- High accuracy measurements
- Customizable hardware and software platform allowing to add new DUT’s
- High reliable protection mechanisms for emergency cases
- Testing of wafer level and packaged PMICs
- Compatible with LabVIEW
- Compatible with testing automation software SINUS